Course Description
You’re surrounded by SPC, but perhaps you’re not quite sure how to use it to your maximum advantage? Not sure how to best react when your process control chart signals an out-of-control situation, or what it may – or may not – be telling you? Not sure how to set your control limits optimally? Not sure how to deal with non-normal data? Topics discussed in detail in this practical full-day course include:
- goals and objectives of SPC – what SPC is, what it is not
- histograms and Pareto diagrams
- Gaussian (normal) distributions
- common SPC charts – e.g., x-bar/s, x-bar/R
- steps to establish a robust SPC chart for a process step
- setting control limits correctly
- identifying and responding to out-of-control situations
- process capability indices (Cp/Cpk) and 6-sigma processes
- boxplots and normal probability plots
- non-normal distributions
- specialized process control charts – e.g., CUSUM, EWMA, p
- identifying and understanding outlier data points
Who Should Attend
This course is designed for all wafer fab personnel who wish to improve their knowledge of and/or practice of SPC. These include
- process engineers and technologists
- equipment engineers and technologists
- process integration engineers
- yield engineers
- production supervisors
- technical managers
Course Notes
A comprehensive, detailed course manual is provided.
Course Fee and Additional Information
To schedule this course at your site or for additional information, including course fees, please contact the course instructor.